STARM · HW-06 · HARDWARE
Radiation-Induced Soft Errors
STARMCatalog entries from the DIPS Threat Inventory. The paper cites that dataset and does not use this name.
Natural bit-flips used to bypass security checks.
Severity in the dataset7/10
Not the paper’s H/M/L.
- Target
- Data / Instructions
- Layer in the inventory
- RAM / Registers
- Mitigation
- Rad-hard hardware and ECC memory.
- How the inventory says to fix it
- Rule-based: ECC and Triple Modular Redundancy (TMR). AI: Predictive models to correlate solar activity with error rates.
- Quick fix
- ECC correction
- ML approaches named
- Isolation Forest, One-Class SVM, Autoencoders, Variational Autoencoders, Gaussian Mixture Models
- Methodology
- Anomaly detection + fault classification ot detect Single Event Upsets (SEUs), Bit flips in memory/registers, Single Event Transients (SETs) , glitches in signals Timing anomalies, Unexpected resets , incorrect computations
- Handler role
- Space Environment Lead
- Stage
- Design/Orbit
- Standard named
- ECSS-E-ST-10-04C
- Status in the inventory
- Avoided
STARMCatalog entries from the DIPS Threat Inventory. The paper cites that dataset and does not use this name.
Connection recorded in the inventory
Memory Corruption